Trial, Error, and Success: 10 Insights into Realistic Knowledge, Thinking, and Emotional Intelligence
Maryann Karinch
Trial, Error, and Success: 10 Insights into Realistic Knowledge, Thinking, and Emotional Intelligence
Trial, Error, and Success: 10 Insights into Realistic Knowledge, Thinking, and Emotional Intelligence
Maryann Karinch
Descripción
Everything in nature evolves by trial and error. We cannot avoid this fundamental method of natural evolution, but our human advantage is that we can think about and learn from the errors before trying again.
Trial, Error, and Success helps boost that advantage with 10 insights into realistic knowledge, thinking, and emotional intelligence
The authors use real-life examples to show how successful thinking avoids overgeneralization traps-the key trick is to focus on the differences between a new circumstance and existing knowledge. You'll discover
- How the right thinking about a new circumstance creates new knowledge by alternating sharp analyses and broad analogies.
- How to use this knowledge to grasp both the risks and the benefits of the new circumstance and to make the best decisions.
- How to reduce personal risk and maximize benefits by collective applications of the trial-and-error method.
It becomes obvious why machine learning and automatic actions cannot replace human intelligence and decision making!
Detalles
| Formato | Tapa suave |
| Número de Páginas | 238 |
| Lenguaje | Inglés |
| Editorial | Armin Lear Press |
| Fecha de Publicación | 2021-04-08 |
| Dimensiones | 9.0" x 6.0" x 0.5" pulgadas |
| Letra Grande | No |
| Con Ilustraciones | No |
Acerca del Autor
Karinch, Maryann
Maryann Karinch is the author of articles, books, and white papers including 33 commercially published books. She founded The Rudy Agency, a full-service literary agency, in 2004.Dimitrijev, Sima
Sima Dimitrijev is a Professor at Griffith University in Australia. He is an educator, a microelectronic engineer, a researcher, an inventor, and the author of two textbooks. He is a member of the Editorial Advisory Board, Microelectronics Reliability, Elsevier/Pergamon, and a Senior Member of IEEE.Garantía & Otros
| Garantía: | 30 dias por defectos de fabrica |
| Peso: | 0.322 kg |
| SKU: | 9781735617480 |
| Publicado en Unimart.com: | 11/01/24 |
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